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Issue Date	Title	Author(s)
1981	Measurement of the Contact Resistance of Screen-Printed Silver Metallization of N+ Silicon	Jung, Mark A
2004	MATLAB Modeling of Branching Morphogenesis	Tseng, Michael
1985	Measurement of the Transport Properties of Resonant Tunneling Structures	Horlbeck, Eric
1981	MAZO (Movies in Almost Zero Effort)	Larrea, J. J.
2000	A Parallel Implementation on a Distributed Memory Multiprocessor System of the Grasp Algorithm for Solving Propositional Boolean Satisfiability	Rocca, Richard M.; Frickey, Robert E.
1992	Measuring the Optical Absorption of Silicon to Infer Temperature: Further Experiments with Heavily Doped Thin Layers and Metallized Wafers	Miller, John C.
2008	Measuring the Seebeck Effect on Organic Semiconductor Thin-Films	Kandabarow, Alexander M.
1996	Memory Bheavior of Dynamically Allocated Data Structures in ParallelShared Memory Systems	Schrock, C. Eric
2010	Measuring Noise Pollution with Mobile Phones	Bachand, Michael; LeVee, Brian
2000	Measuring Impact: Putting the Efficiency of SIMD Architecture on the Line	Hirakawa, Keigo