Please use this identifier to cite or link to this item:
http://arks.princeton.edu/ark:/88435/dsp01gm80hx37m| Title: | Measurement of the Contact Resistance of Screen-Printed Silver Metallization of N+ Silicon |
| Authors: | Jung, Mark A |
| Department: | Electrical Engineering |
| Class Year: | 1981 |
| Extent: | 51 Pages |
| Other Identifiers: | 3070 |
| URI: | http://arks.princeton.edu/ark:/88435/dsp01gm80hx37m |
| Location : | This thesis can be viewed in person at the Mudd Manuscript Library. To order a copy complete the Senior Thesis Request Form. For more information contact mudd@princeton.edu. |
| Type of Material: | Princeton University Senior Theses |
| Appears in Collections: | Electrical Engineering, 1932-2020 |
Files in This Item:
There are no files associated with this item.
Items in Dataspace are protected by copyright, with all rights reserved, unless otherwise indicated.