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  2. Princeton University Undergraduate Senior Theses, 1924-2020

Princeton University Undergraduate Senior Theses, 1924-2020

Members of the Princeton community wishing to view a senior thesis from 2014-2020 while away from campus should follow the instructions outlined on the OIT website for connecting to campus resources remotely.

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Items (Sorted by Submit Date in Descending order): 12561 to 12580 of 68801
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Issue DateTitleAuthor(s)
1981Microprocessor Based Air Conditioning ControllerNicholas, James A.
1998Micromouse - A Maze-Solving RobotBhave, Prashant; Chen, Haiyin; Gelfand, Sara; Perlow, Jonathan; Webster, Nathaniel
1998Micromouse - A Mase-Solving Robot IIBhave, Prashant; Chen, Haiyin; Gelfand, Sara; Perlow, Jonathan; Webster, Nathaniel
1982Microelectronic Device Vulnerability: An Experiment in Low-Level Energy/Information Tranfer: Part IICook, Ian Ainsworth
1982Microelectronic Device Vulnerability: An Experiment in Low-Level Energy/Information Tranfer: Part ICook, Ian A.
2011Microelectrode Arrays Employing Collagen for Improved Neural RecordingMiller, Alfred
1983Microcomputer-Controlled Robotics SystemSmith, Michael David
1982Micro-Computer Adaption to Practical SystemsHinojosa, Rudy M.
2007A Perception System for Autonomous Vehicle Navigation: Multiple Object Tracking Using a Nearest-Neighbour AlgorithmShum, Arthur Chun Hong
1998METAVIS - Micro Air Vehicle Project - Miniature Electric Tele-Operated Airborne Visual Imaging SystemLewis, Tyler
1998METAVIS - Micro Air VehicleLewis, Tyler
1999MEMS Process Development for Future Princeton Undergraduate ClassesReali, Jon Charles
2007Memory Network Maintenance Using Spike-Timing Dependent PlasticityJangraw, David Coulter
1967Memory Mechanism Protein and RNATriller, Bruce
1996Memory Bheavior of Dynamically Allocated Data Structures in ParallelShared Memory SystemsSchrock, C. Eric
1993Medical Image EnhancementNiu, Edward
2008Measuring the Seebeck Effect on Organic Semiconductor Thin-FilmsKandabarow, Alexander M.
1992Measuring the Optical Absorption of Silicon to Infer Temperature: Further Experiments with Heavily Doped Thin Layers and Metallized WafersMiller, John C.
2010Measuring Noise Pollution with Mobile PhonesBachand, Michael; LeVee, Brian
2000Measuring Impact: Putting the Efficiency of SIMD Architecture on the LineHirakawa, Keigo
Items (Sorted by Submit Date in Descending order): 12561 to 12580 of 68801
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