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http://arks.princeton.edu/ark:/88435/dsp018s45qc280Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.advisor | Johnson, Walter C. | - |
| dc.contributor.author | Han, Chien-Jih | - |
| dc.date.accessioned | 2017-05-17T20:55:45Z | - |
| dc.date.available | 2017-05-17T20:55:45Z | - |
| dc.date.created | 1980-05-16 | - |
| dc.date.issued | 1980 | - |
| dc.identifier.other | 27472 | - |
| dc.identifier.uri | http://arks.princeton.edu/ark:/88435/dsp018s45qc280 | - |
| dc.format.extent | 47 pages | * |
| dc.language.iso | en_US | en_US |
| dc.title | Current Reduction Caused by the Generation of Interface States in the Si-SiO2 System | en_US |
| dc.type | Princeton University Senior Theses | - |
| pu.date.classyear | 1980 | en_US |
| pu.department | Electrical Engineering | en_US |
| pu.pdf.coverpage | SeniorThesisCoverPage | - |
| pu.location | This thesis can be viewed in person at the <a href=http://mudd.princeton.edu>Mudd Manuscript Library</a>. To order a copy complete the <a href="http://rbsc.princeton.edu/senior-thesis-order-form" target="_blank">Senior Thesis Request Form</a>. For more information contact <a href=mailto:mudd@princeton.edu>mudd@princeton.edu</a>. | - |
| Appears in Collections: | Electrical Engineering, 1932-2020 | |
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