Characterization of Noise in Thin-­‐Film Transistors

Abstract

At its very core,the design of circuits is about balancing tradeoffs between power consumption,robustness,and bandwidth. One of the primary reasons that these tradeoffs must be made is the existence of electrical noise. A good understanding of the nature of noise of each of the circuit’s elements is necessary in order to fully understand and properly take advantage of the tradeoffs in the circuit’s design. In large area electronic systems,the most fundamental noise-­introducing device is the thin-­‐film transistor,or TFT. This project aims to design a system for the measurement and characterization of the noise of TFTs so that better large area circuits and systems can be designed.