Browsing by Author Lee, Sherry F.
Showing results 1 to 1 of 1
| Issue Date | Title | Author(s) |
|---|---|---|
| 1989 | Non-Destructive Methods to Measure the Refractive Index and Thickness of Thin Films of SiGe Grown on Si Substrates | Lee, Sherry F. |
| Issue Date | Title | Author(s) |
|---|---|---|
| 1989 | Non-Destructive Methods to Measure the Refractive Index and Thickness of Thin Films of SiGe Grown on Si Substrates | Lee, Sherry F. |